Scintillation Screens and Optical Technology for transverse Profile Measurements

Scintillation screens are widely used at all kind of accelerators for transverse profile measurements as they delivers at direct image of the 2-dim beam distribution. However, the choice of an appropriate scintillation material depends on the beam parameters to guarantee sufficient sensitivity, spatial resolution and dynamic range. The physical basis of the scintillation process will be discussed to enable the understanding of possible limitation like saturation effects or resolution limits. The experiences and applicability obtained at various accelerator facilities will be described. Moreover, the optical solutions and camera technology in terms of sensitivity and radiation hardness are an important part of such beam instrumentation.